Victoria University Antarctic Research Expedition Science and Logistics Reports 1980-81: VUWAE 25
[Ray Tracing Analysis]
The analysis used here is suitable for this situation where the refracting interface being mapped is sharply curved, so ray paths don't travel along the interface and leave at the critical angle, but instead cut through the bulk of the material.
You need to know the structure above the interface and the depth of the interface either under the spread or the shot point, as well as the velocity below the interface. In the present case the interface was the basement surface, and was fairly flat near shot point II (SP II) and its depth ZA was obtained from the time intercept as SP II.